[ Identification | Description | Input parameters | Links ]
SOLEIL_SIXS InstrumentSixS (Surface Interface X-ray Scattering) is a beamline dedicated to the study of X-ray scattering from surfaces and interfaces of hard and soft matter in various environments in the 5-20 keV energy range. To be sensitive to the surface all the studies are performed in grazing-incidence geometry. The beamline is equipped with two experimental hutches, which ae dedicated to the study of surfaces, interfaces and nano-objets prepared: - in-situ under UHV (Ultra High Vacuum, i.e. 10-10 mbar) conditions. A diffractometer allows to measure X-ray scattering from samples under UHV; - in various environments (catalysis chambers, soft matter, electrochemical cells). A diffractometer coupled with exchangeable chambers will be able to measure X-ray scattering from sample surfaces both in vertical or horizontal geometries. Grazing Incidence X-ray Diffraction (GIXD), Grazing Incidence Small Angle X-ray Scattering (GISAXS), anomalous surface X-ray scattering, X-Ray Reflectivity (XRR), magnetic surface X-ray scattering and coherent scattering experiments are performed on both the facilities. In this implementation, the multipurpose diffractometer is used, with a thin single crystal layer on top of a Si bulk. Position | Element ---------|-------------------------------------------------------------------- 0 | the U20 undulator 15 | Slit S1 2x0.7 mm^2 16.5 | a Si(111) DCM, 40x40x10 mm^3 E0=5-20 keV 26 | Mirror M1 Si coated with Pd, elliptically vertical focusing 20x350x20 mm^3 Incident angle 0.175 deg (3 mrad) 28 | Mirror M2 at 20x550x20mm^3. (tilted 45 deg exchange horz/vert components for UHV) 33 | multipurpose diffractometer 42 | UHV diffractometer (not modelled here) Example: E0=10 Detector: mon_spl_fluo_I=3.66859e+14
| Name | Unit | Description | Default |
| E0 | keV | Nominal energy at the Wiggler. | 13 |
| dE | keV | Energy half-bandwidth at the Wiggler | 0.1 |
| dcm_theta | deg | Rotation angle of the DCM. 0=set from energy E0 | 0 |
| M1_angle | mrad | Rotation angle of M1/M2 mirrors. When left as 0, it is set automatically from E0. | 3 |
| M1_radius | m | Curvature radius of M1 mirror (Rh, 1300x100) longitudinal. Positive=mirror is focusing. 0=flat. | 1400 |
| M2_radius | m | Curvature radius of M2 mirror (Rh, 1300x100) sagittal. Positive=mirror is focusing. 0=flat. | 1400 |
| sample_coating | str | Reflection/structure data file for the single crystal thin layer coating | "Mo.lau" |
| sample_bulk | str | Reflection/structure data file for the single crystal bulk | "Si.lau" |
| sample_thickness | m | The single crystal thin layer coating thickness | 50e-10 |
| sample_angle | deg | The sample tilt angle (around X axis) | 0.175 |
SOLEIL_SIXS.instr.
[ Identification | Description | Input parameters | Links ]
Generated on 2024-07-01 12:32:10