[ Identification | Description | Input parameters | Links ]

The `MAXII_811` Instrument

XAFS and surface diffraction, Materials Science Beamline 811 at MAX-lab.

Identification

Site: MAXII
Author: Erik B Knudsen (erkn@fysik.dtu.dk)
Origin: DTU Physics
Date: Jan 23, 2011

Description

Fed by a wiggler, this beamline operates in monochromatic mode with an
operational energy tunable between 2.3 – 20 keV (0.6 - 5.3 AA).
The wavelength is chosen by a double monochromator crystal setup where either
Si 111 or Si 311 may be chosen. Furthermore a double mirror
setup may be used to to focus the beam onto a sample. The rotation of the
first mirror defines the position of the second which is computed automatically.
If mirrors are in the monochromators are automatically reposistioned to
accomadate the deflected beam.

Input parameters

Parameters in boldface are required; the others are optional.

Name	Unit	Description	Default
Emin	keV	Minmium energy of radiation emitted from wiggler.	1e-3
Emax	keV	Maxmium energy of radiation emitted from wiggler.	12
prim_h	m	Horizontal opening of primary slits.	.40e-3
prim_v	m	Vertical opening of primary slits.	0.6e-3
xafs_h			3e-3
xafs_v			3e-3
M1		Is mirror 1 in the beam?	0
M1_R	m	Radius of curvature of mirror 1.	2000
M1_pitch	deg	Central glancing angle of mirror 1.	0
M2		Is mirror 2 in the beam?	0
M2_R	m	Radius of curvature of mirror 2.	800
M2_pitch	deg	Central glancing angle of mirror 2.	0
theta	deg	Scattering angle of monochromators	14.226
TTH	deg	Angle at which to put the surface diffraction detector	0
ATT1		Should attenuation filter 1 be in the beam?	0
ATT2		Should attenuation filter 2 be in the beam?	0
ATT3		Should attenuation filter 3 be in the beam?	0
XAFS			0

The MAXII_811 Instrument

Identification

Description

Input parameters

Links

The `MAXII_811` Instrument